| Title | Low frequency Raman modes of Bi2-xPbxSr 1:6Ln0:4CuO6-δ |
| Publication Type | Journal Article |
| Year of Publication | 2012 |
| Authors | Mallett, B. P. P., Schnyder T., Williams G. V. M., and Tallon J. L. |
| Journal | Materials Science Forum |
| Volume | 700 |
| Pagination | 11-14 |
| ISSN | 02555476 |
| ISBN Number | 9783037852637 |
| Keywords | Apical oxygen, Bi-2201, Bi-based, Doping state, Experimental errors, Lead, Low-frequency Raman, Lower frequencies, Nanotechnology, Polycrystalline, Polycrystalline materials, Raman measurements, Raman modes, Unit cells |
| Abstract | Raman measurements were made on polycrystalline Bi2-xPb xSr1:6Ln0:4CuO6-δ for Ln=fLa, Nd, Sm, Eug with various x and doping states. Our measurements suggest a significant Bi contribution to the 118cm-1 mode but not to the 70cm-1 mode which instead shifts to lower frequencies with increasing number of CuO2 layers in the Bi-based family. Shifts in the O(2)Sr apical oxygen mode can be attributed to unit cell contraction within experimental error. © (2012) Trans Tech Publications, Switzerland. |
| URL | http://www.scopus.com/inward/record.url?eid=2-s2.0-80053934755&partnerID=40&md5=3dd630f6b89e10d4f1fac2d02f8d1fe6 |
| DOI | 10.4028/www.scientific.net/MSF.700.11 |
